Discrete Device Test System QT-6000

QT-6000 test system is applied to test small and medium-sized power triode diode MOS-FET(IGBT) and wafer etc. updated system can cover built-in capacitance(DC+CAP) and Scanbox test.

The characteristics of：

· High-speed test, UPH>40K

· One for two to achieve 100% FT+QA parallel test

· Advanced capacitor high-speed test program to achieve CAP+DC same-station test

· Built-in UIS test program to achieve DC+UIS same-station test

· LCR accurate capacitance test, the minimum test capacitance value is 100fF

Major Technical Parameters

Measurement Accuracy	Current: ＜0.5% Reading + 0.05% FullRange + 1.5nA Voltage: ＜0.5% Reading + 0.05% FullRange + 1.5mV Capacitance: 0.5% Reading + 0.05% FullRange + 10fF
Technical indicator	Max Current/Voltage30A /1200V Capacitance Measurement range:0.2-300pF(BIAS voltage range 0~80V,1MHz) LCR Measurement Range：0.1pF-0.1uF（DC Bias：0-30V, 1MHZ）
DPI	16 bit ADC/DAC
Waveform	Built-in oscilloscope

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