Test System
QT-6000 SeriesDiscrete Device Test System QT-6000
QT-6000 test system is applied to test small and medium-sized power triode diode MOS-FET(IGBT) and wafer etc. updated system can cover built-in capacitance(DC+CAP) and Scanbox test.
The characteristics of:
· High-speed test, UPH>40K
· One for two to achieve 100% FT+QA parallel test
· Advanced capacitor high-speed test program to achieve CAP+DC same-station test
· Built-in UIS test program to achieve DC+UIS same-station test
· LCR accurate capacitance test, the minimum test capacitance value is 100fF
Major Technical Parameters
Measurement Accuracy | Current: <0.5% Reading + 0.05% FullRange + 1.5nA Capacitance: 0.5% Reading + 0.05% FullRange + 10fF |
Technical indicator | Max Current/Voltage30A /1200V Capacitance Measurement range:0.2-300pF(BIAS voltage range 0~80V,1MHz) LCR Measurement Range:0.1pF-0.1uF(DC Bias:0-30V, 1MHZ) |
DPI | 16 bit ADC/DAC |
Waveform | Built-in oscilloscope |
2021-03-17
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2019-03-22
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2019-03-13
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Industrial Base,Nanhai National High-tech Zone,
Foshan,Guangdong, China
Tel:+86 757 83214396
+86 757 82803659/81992331(service)
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