Discrete Device Test System QT-4100

QT-4100 discrete device test system suitable for triode diode Zener diode MOS-FET (IGBT SIC gallium nitride) J-FET Current Sense FET LDO (78XX 79XX TL431 TL432 conventional test) Optocouplers and other products and wafers. Expansion: SCR test SCANBOX Dual Gate-FET Q Plus transistor switching time (TST TR TF TON) thermal resistance test (DVDS DVCE DVBE DVF) etc.

Characteristic：

• Wide test coverage, test circuit support voltage-limiting and current-limiting state, which able to protect the DUT effectively.

• Foolproof measurement: Voltage & current automatic self-check, automatic alarm triggered and halt if any abnormality detected.
• LOW RDON。
• Quick Self-test: No external load is required, able to complete in 2 minutes
• 3rd party calibration: Apply industry standard Keysight 34401A for calibration
• Built-in Oscilloscope function.
• Support multiple test station data merging.

Major Technical Parameters

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