Test System
QT-4000 SeriesDiscrete Device Test System QT-4100
QT-4100 discrete device test system suitable for triode diode Zener diode MOS-FET (IGBT SIC gallium nitride) J-FET Current Sense FET LDO (78XX 79XX TL431 TL432 conventional test) Optocouplers and other products and wafers. Expansion: SCR test SCANBOX Dual Gate-FET Q Plus transistor switching time (TST TR TF TON) thermal resistance test (DVDS DVCE DVBE DVF) etc.
Characteristic:
• Wide test coverage, test circuit support voltage-limiting and current-limiting state, which able to protect the DUT effectively.
• Foolproof measurement: Voltage & current automatic self-check, automatic alarm triggered and halt if any abnormality detected.
• LOW RDON。
• Quick Self-test: No external load is required, able to complete in 2 minutes
• 3rd party calibration: Apply industry standard Keysight 34401A for calibration
• Built-in Oscilloscope function.
• Support multiple test station data merging.
Major Technical Parameters
2021-03-17
PowerTECH successfully exhibited in S...Semicon China 2021 was successfully held at S...
2019-03-22
PowerTECH successfully participated i...Semicon China 2019 was held at Shanghai New I...
2019-03-13
The Party Secretary of Foshan, Lu yi,...On 13th March 2019, The Party Secretary of Fo...
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Add:No.16 Guangming Ave.,New Light Source
Industrial Base,Nanhai National High-tech Zone,
Foshan,Guangdong, China
Tel:+86 757 83214396
+86 757 82803659/81992331(service)
We have developed a close and persistent relationship with our customers, with the increasing of global automation, we will do our utmost to accurately satisfy our customer’s needs and improve the diversity of our products and applications. We will work tirelessly on pursuing stable and reliable product quality, in order to meet our customer’s needs.